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65 GHz Sampling Oscilloscope DCA1065
65 GHz Sampling Oscilloscope DCA1065
Up to 4 channels of 112
GBaud PAM4 signal testing 

for 1.6Tbps optical modules

65 GHz Sampling Oscilloscope DCA1065
1.6T Bit Error Ratio <br />Tester PBT3058
1.6T Bit Error Ratio
Tester PBT3058
Built-in water-cooled MCB Kit and
extensible remote head options
1.6T Bit Error Ratio <br />Tester PBT3058
Semiconductor Parameter Analyzer <br />SA8000
Semiconductor Parameter Analyzer
SA8000
0.1 fA Current Measurement
18-Slot PXIe Architecture
Semiconductor Parameter Analyzer <br />SA8000
SiPh Wafer Test System sCT9002
SiPh Wafer Test System sCT9002
Edge Coupling/Vertical Coupling,

Compatible with 8-12 inch wafers

SiPh Wafer Test System sCT9002
Wafer Level Burn-In System<br>WLBI3810
Wafer Level Burn-In System
WLBI3810
Seamless parallel burn-in

test for 9 wafers

Wafer Level Burn-In System<br>WLBI3810
SiC KGD Die Handler<br>PB6800
SiC KGD Die Handler
PB6800
Modular design enables flexible loading, unloading, and multi -

site configuration.

SiC KGD Die Handler<br>PB6800
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