Tech Academy - NEXUSTEST

17
Jul 2026

Empowering SiC High-Volume Manufacturing: Advanced Parallel Testing with KGD Dual-Die Sockets
As the electric vehicle (EV) industry rapidly evolves, Silicon Carbide (SiC) has firmly established itself as the core component for EV traction inverters.
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15
Jul 2026

Die-Level KGD Testing for CPO Optical Engines: Advancing Optoelectronic and High-Speed Test Methodologies
Driven by the exponential surge in computing demand, Co-Packaged Optics (CPO) has emerged as a focal point in data center architecture and advanced packaging.
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30
Mar 2026

Nexustest SA8000 – Semiconductor Device Analyzer
Today, we are officially launching the new-generation Semiconductor Device Analyzer SA8000. Built on an architecture with fully independent intellectual property rights, a high-end test platform that combines sub-femtoampere current resolution and modular
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27
May 2025

Unveiling SiC Reliability: Insights into the Burn-In Process, HTRB, and HTGB Testing
Silicon Carbide (SiC) MOSFETs have emerged as game-changers in power electronics due to their wide bandgap, enabling them to handle significantly higher voltages and temperatures than traditional silicon devices.
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