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Laser Diode Test
CT6201-DC
CoC Test System
Nexustest fully automated CoC testing system CT6201 offers convenience and efficiency that make it the optimal choice for CoC mass production. It uses the same testing fixtures with BI6201, simplifying the chip loading and unloading process and eliminating potential EOS/ESD risks during the process. The patented optical power coupling system design ensures the speed and repeatability of optical coupling and spectrum testing. With its unique dual testing stage design, each stage features independent temperature control, reducing waiting time for heating and cooling. Dual-sided CoC fixtures make the parallel test feasible to improve production efficiency significantly.
Highlights
  • CoC and probe card stay attached
    During the burn-in and testing process, the CoC and probe card stay attached to minimize damage caused by the probe to the CoC
  • Temperature range
    Standard: 25°C to 100°C
    Low temperature optional: -10°C to 100°C
  • High testing efficiency
    CoC testing time < 7.5s
  • Automatic loading and unloading fixture
    Holds up to 6 fishbone fixtures with one magazine
  • High testing accuracy
    Threshold current repeatability: ＜±1%
    Power repeatability: <±1%
    Wavelength repeatability: <±0.15 nm
    SMSR repeatability: <5 dB
  • Self-developed SMU
    Integrating Nexustest self-developed precision SMU by default
  • Software functions
    All test results, statuses, and abnormal records are automatically saved to the database efficiently and traceable
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