Semiconductor Device Analyzer

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Home · Products · Electronic Measurement · Semiconductor Device Analyzer ·

Semiconductor Device Analyzer

SA8000

Semiconductor Device Analyzer

Nexustest SA8000 is a versatile, highly integrated semiconductor device analyzer designed for efficient and precise device characterization. The system offers a comprehensive suite of measurement capabilities, including standard DC I-V and C-V characterization, as well as high-precision transient pulse testing. With its exceptional measurement stability and high data reproducibility, the SA8000 provides a thorough and reliable parameter analysis solution for even the most complex devices.

Highlights

Highlights

A high-end test platform

Sub-fA current resolution
Ultra-low current detection

0.1 fA（10^-16 A）current measurement resolution
Fully integrated multi-dimensional testing capabilities

Flexible combinations of DC IV, CV, and fast-pulse measurement units
No-code quick test mode

Quick characterization of device curves or key parameters