Addressing Manufacturing Test Challenges
Conversations at the booth covered wafer acceptance testing (WAT), source measure unit (SMU) testing efficiency in high-volume production, and the stability of high-precision dynamic I–V measurements. Attendees also explored testing approaches for silicon photonics, CPO, and NPO applications.
Nexustest presented its OE Die-Level KGD Test Handler and Prober during these discussions, focusing on die-level testing needs and the role of test capability in supporting production workflows.
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Turning Application Needs into Technical Dialogue
These exchanges offered a direct channel to capture practical requirements from engineers and industry professionals. Discussion priorities included test throughput, measurement stability, and the unique demands of emerging semiconductor and photonics applications. We sincerely appreciate all attendees for the insightful conversations and real-world requirements shared at the booth. Nexustest will follow up on all booth consultations and continue to integrate application feedback into its technical development and product planning.
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With these valuable industry dialogues captured, Nexustest sets its sights on our upcoming showcase. We are set to bring our evolving test portfolio to SEMICON Europa 2026, co-located with electronica 2026, in Munich, Germany this November, ready to advance further joint innovation with the global semiconductor community.
